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PRODUCTS
ZSX Primus400
ZSX Primus400
SEQUENTIAL WAVELENGTH DISPERSIVE XRF SPECTROMETER FOR LARGE SAMPLES
Elemental analysis of solids, liquids, powders, alloys and thin films
Features
Large sample analysis
Up to 400 mm (diameter)
Up to 50 mm (thickness)
Up to 30 kg (mass)
Sample adapter system
Adaptable to various sample sizes
Measurement spot
30 mm to 0.5 mm diameter
5-step automatic selection
Mapping capability
Allows multipoint measurements
Sample view camera (option)
General purpose
Analyze Be - U
Elemental range: ppm to %
Thickness range: sub Å to mm
Diffraction interference rejection (option)
Accurate results for single-crystal substrates
Compliance with industry standards
SEMI, CE marking
Small footprint
50% footprint of the previous model
Saite uz ražotāja mājas lapu:
ZSX Primus400
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