ZSX Primus400

SEQUENTIAL WAVELENGTH DISPERSIVE XRF SPECTROMETER FOR LARGE SAMPLES

Elemental analysis of solids, liquids, powders, alloys and thin films

Features

Large sample analysis
- Up to 400 mm (diameter)
- Up to 50 mm (thickness)
- Up to 30 kg (mass)
Sample adapter system
- Adaptable to various sample sizes
Measurement spot
- 30 mm to 0.5 mm diameter
- 5-step automatic selection
Mapping capability
- Allows multipoint measurements
Sample view camera (option)
General purpose
- Analyze Be - U
- Elemental range: ppm to %
- Thickness range: sub Å to mm
Diffraction interference rejection (option)
- Accurate results for single-crystal substrates
Compliance with industry standards
- SEMI, CE marking
Small footprint
- 50% footprint of the previous model

Saite uz ražotāja mājas lapu: ZSX Primus400

Papildoma informacija