INQUIRIES
Please send your inquiries to armgate(@)armgate.lv or fill out the form in the Contacts sectionXRTmicron
X-RAY TOPOGRAPHY IMAGING SYSTEM
For non-destructive evaluation of single-crystalline materials
| Technique | X-ray topography |
| Benefit | Non-destructive evaluation of single-crystalline materials |
| Technology | Imaging using X-rays |
| Core attributes | High-flux multi-target X-ray source, CCD imager |
Saite uz ražotāja mājaslapu: XRTmicron
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