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  • Simultix 15

Simultix 15

TUBE-ABOVE SIMULTANEOUS WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROMETER
High-throughput elemental analysis of solids, powders and alloys

Features

  • Synthetic multi-layers, RX-SERIES
    • New synthetic multi-layer crystal ”RX85”produces about 30% greater intensity than existing multi-layers for Be-Ka and B-Ka.
  • XRD channel
    • Equipped with XRD channel, Simultix 15 can be performed the quantitative analysis by XRF and XRD.
  • Doubly curved crystal
    • Optional doubly curved crystal can be equipped to fixed channel. The intensity by doubly curved crystal increases compared with single curved crystal.
  • Improved software is easy to use
    • Simultix 15 software has enhanced operability of quantitative condition setting by adopting a quantitative analysis flow bar same as the ZSX software.
  • Heavy and light scanning goniometer
    • Optional wide elemental range goniometer supports standardless semi-quant (FP), and may be used for qualitative or quantitative determination of non-routine element.
  • BG measurement for trace elements
    • Optional background measurement (BG) for fixed channel, resulting in improved calibration fits and superior accuracy.
  • Automatic Pressure Control (APC)
    • Optional APC system maintains a constant vacuum level in the optical chamber to dramatically improve light element analysis precision.
  • Quantitative scatter ratio method
    • When utilizing the Compton scattering ratio method, for ore and concentrate analysis, optional quantitative scatter ratio method generates theoretical alphas for scattering ratio calibration.
  • Up to 40 fixed channels
    • Standard 30 fixed channel configuration that may be optionally upgraded to 40 channels.
  • Automation
    • Optional Sample Loading Unit provides belt-in feed from a third party sample preparation automation system.

Saite uz ražotāja mājaslapu: Simultix 15

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