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  • AutoMATE II

AutoMATE II

MICRO-AREA X-RAY RESIDUAL STRESS MEASUREMENT SYSTEM
Highly accurate micro area residual stress with both iso- and side-inclination methods

Specifikācija

TechniqueX-ray diffraction (XRD)
BenefitResidual stress measurement on large and/or heavy objects by XRD
TechnologySpecialty 2-axis X-ray diffractometer with mapping capability
Core attributes3 kW sealed X-ray tube, D/teX Ultra 1000 silicon strip detector

Saite uz ražotāja mājas lapu: AutoMATE II

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