INQUIRIES
Please send your inquiries to armgate(@)armgate.lv or fill out the form in the Contacts sectionAutoMATE II
MICRO-AREA X-RAY RESIDUAL STRESS MEASUREMENT SYSTEM
Highly accurate micro area residual stress with both iso- and side-inclination methods
Specifikācija
| Technique | X-ray diffraction (XRD) |
| Benefit | Residual stress measurement on large and/or heavy objects by XRD |
| Technology | Specialty 2-axis X-ray diffractometer with mapping capability |
| Core attributes | 3 kW sealed X-ray tube, D/teX Ultra 1000 silicon strip detector |
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