Simultix 15

Features

• Synthetic multi-layers, RX-SERIES
  • New synthetic multi-layer crystal ”RX85”produces about 30% greater intensity than existing multi-layers for Be-Ka and B-Ka.
• XRD channel
  • Equipped with XRD channel, Simultix 15 can be performed the quantitative analysis by XRF and XRD.
• Doubly curved crystal
  • Optional doubly curved crystal can be equipped to fixed channel. The intensity by doubly curved crystal increases compared with single curved crystal.
• Improved software is easy to use
  • Simultix 15 software has enhanced operability of quantitative condition setting by adopting a quantitative analysis flow bar same as the ZSX software.
• Heavy and light scanning goniometer
  • Optional wide elemental range goniometer supports standardless semi-quant (FP), and may be used for qualitative or quantitative determination of non-routine element.
• BG measurement for trace elements
  • Optional background measurement (BG) for fixed channel, resulting in improved calibration fits and superior accuracy.
• Automatic Pressure Control (APC)
  • Optional APC system maintains a constant vacuum level in the optical chamber to dramatically improve light element analysis precision.
• Quantitative scatter ratio method
  • When utilizing the Compton scattering ratio method, for ore and concentrate analysis, optional quantitative scatter ratio method generates theoretical alphas for scattering ratio calibration.
• Up to 40 fixed channels
  • Standard 30 fixed channel configuration that may be optionally upgraded to 40 channels.
• Automation
• Optional Sample Loading Unit provides belt-in feed from a third party sample preparation automation system.

Saite uz ražotāja mājaslapu: Simultix 15