Scientific research

Solver Nano is designed by the NT-MDT team that also created High Performancel Systems like Ntegra, NEXT and Spectra which have been proven in the scientific community through many key publications. 

Solver Nano is equipped with a professional 100 micron CL (closed loop XYZ) piezotube scanner with low noise capacitance sensors. Capacitance sensors in comparison with strain gauge and optical sensors have lower noise and higher speed in the feedback signal. The CL scanner is controlled by a professional workstation and software.
These capabilities enable all of the basic  AFM techniques in compact SPM design.


SOLVER Nano is enabled for teaching principles of scanning probe microscopy and acquiring skills for studying nanoobjects and microstructures. Students can also perform all modern AFM and STM techniques with SOLVER Nano:

In Air: AFM (contact and intermittent contact), AFM spectroscopy, AFM lithography (force, current, voltage), Lateral Force Microscopy, Force Modulation Microscopy, Spreading Resistance Imaging, Piezoresponce Force Microscopy and Switching Spectroscopy, EFM, Kelvin Probe Force Microscopy, MFM, STM (microscopy, spectroscopy, lithography).
In liquid: Contact and Amplitude Modulation AFM, AFM Spectroscopy, AFM Force Lithography, Lateral Force Microscopy.

SOLVER Nano for education provides complete didactic materials for different skill levels of young aspiring scientists.
Basic level: to demonstrate various phenomena and develop skills to work on modern equipment.
Advanced level: designed for advanced studies with higher skilled students to provide insights on composite nature of modern research and interdisciplinary connections.
Research level: performed individually. Example are given on actual problems to demonstrate the structure of scientific research, form skills of designing and performing experiments, work with scientific advisers – tutors and prepare to engage in independent research.

SOLVER Nano for metrology applications.
SOLVER Nano AFM can be used for educational / scientific projects as well as for routine measurements. It can also be used as a metrological tool for the determination of linear dimensions of objects in the nanometer range.

Technical requirements for metrology appliocations:

  •  Large field scanner – 100x100 um piezotube scanner.
  •  High level XYZ linearity - < 0.1%
  •  Low noise XY sensor – < 0.3 nm in closed loop, < 0.05 nm open loop
  •  Low noise Z sensor – < 0.04 nm in closed loop, < 0.01 nm open loop
  •  Precision capacitance sensors.
  •  Professional software with the common metrological protocols.

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