NTEGRA Spectra

Integration: The key to the new sciences
Change happens at interfaces and today’s most exciting changes in microscopy are happening where multiple technologies are interfaced together. NTEGRA Spectra is a prime example, uniting the full power of atomic force microscopy (AFM), confocal Raman and fluorescence microscopy and scanning near-field optical microscopy (SNOM) in one platform.

Different configuration of AFM with confocal Raman/Fluorescence microscope

•     Atomic Force Microscopy ( > 30 modes )

•     Confocal Raman / Fluorescence / Rayleigh Microscopy
•     Scanning Near-Field Optical Microscopy ( SNOM / NSOM )
•     Optimized for Tip Enhanced Raman and Fluorescence (TERS, TEFS, TERFS) and scattering SNOM (s-SNOM)

Working principle


  • AFM (mechanical, electrical, magnetic properties, nanomanipulation etc.)
  • White Light Microscopy and Confocal Laser (Rayleigh) Imaging
  • Confocal Raman Imaging and Spectroscopy
  • Confocal Fluorescence Imaging and Spectroscopy
  • Scanning Near-Field Optical Microscopy (SNOM)
  • Tip Enhanced Raman and Fluorescence Microscopy (TERS, TEFS, TERFS)

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