GCMS-TQ8040

The Shimadzu GCMS-TQ8040 is the first triple quadrupole with Smart Productivity for high efficiency sample throughput, Smart Operation for quick and easy method development, and Smart Performance for low detection limits and Scan/MRM.
These 3 smart technologies contribute to Smart MRM, and provide the most accurate, cost effective, and easy-to-use triple quadrupole GCMS you have ever imagined.

Innovative Technologies that Improve Accuracy and Throughput

Thanks to two new technologies, the GCMS-TQ8040 enables high-sensitivity, high-precision analyses, even in simultaneous analyses with more than 400 components. For the first new technology, a new firmware protocol was introduced. As a result, data loading efficiency is improved, enabling MRM analysis with up to 32,768 transitions in a single analysis. For the second, "Smart MRM" was newly incorporated into the software. This method creation function automatically sets the optimal measurement time for each component. Data is only acquired for the elution time for the target components, so more components can be analyzed simultaneously than with previous models, without compromising sensitivity even in multi-component simultaneous analyses.
While 400 pesticide components are conventionally separated for measurement in two or three methods, they can be aggregated by the GCMS-TQ8040 into a single method, so the number of analysis cycles can be significantly reduced.

Twin Line MS System Eliminates the Need to Vent the MS

The GCMS-TQ8040 is capable of accepting installation of two narrow-bore capillary columns into the MS simultaneously. This allows you to switch applications without venting the MS.
Simply decide which column is best for your analysis and choose the associated injection port.
CID gas control is a method parameter, allowing acquisition of GC-MS and GC-MS/MS data in the same batch. By coupling this with the Twin Line MS System, analysis of VOCs by SIM and analysis of pesticide by MRM is possible in a single batch without venting the MS.
High-Sensitivity Ion Source
The effect of the filament’s electric potential on the ion source is reduced by placing more distance between the filament and ion source box. In addition, a shield blocks out radiant heat generated from the filament to ensure the ion source box temperature remains uniform. Since this prevents any active spots within the ion source, it provides higher sensitivity for analysis. (Patent: US7939810)
OFF-AXIS Ion Optics
Lower detection limits are achieved by OFF-AXIS Ion Optics (Patent Pending). Meta-stable and neutral ions are removed without sacrificing sensitivity. Helium buffer gas is not required in the CID cell.
High-Speed Scanning Control (Advanced Scanning Speed Protocol, ASSPTM)
ASSP achieves scan speeds of 20,000 u/second. The rod bias voltage is dynamically optimized during ultrahigh-speed data acquisition, thereby minimizing the drop in sensitivity that would otherwise occur above 10,000 u/second. This is necessary for maintaining sensitivity at high scan speeds and acquiring superior mass spectra when performing product ion scans or simultaneous scan and MRM measurement in the Scan/MRM mode. (Patent: US6610979).  Scan/MRM simultaneous analysis is possible by coupling high speed scanning with high speed MRM.

Sensitivity and Repeatability in Single GC/MS Mode

The high-efficiency ion source provides the foundation of an ion generation and transmission system, which creates and then delivers ions to the detector, resulting in a GC/MS with the maximum possible sensitivity and repeatability. These features are not realized just for MRM measurements by GC/MS/MS, but also for scan and SIM measurements in single quadrupole modes, even with the most reactive compounds.
 
 

 

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